Publications

1. Irina Harder,Gerd Leuchs,Klaus Mantel, and Johannes Schwider:
   Adaptive frequency comb illumination for interferometry
   APPLIED OPTICS , 50, No. 25 , p.4942-4956 ( 2011)


2. Vanusch Nercissian, Irina Harder, Klaus Mantel, Andreas Berger, Gerd Leuchs, Norbert Lindlein, and J. Schwider:
   Diffractive simultaneous bidirectional shearing interferometry using tailored spatially coherent light
   Appl. Opt., 50, p.571-578 (2011)


3. J. Schwider, G. Leuchs:
   Multi-pass Shack-Hartmann planeness test: monitoring thermal stress
   Optics Express, Vol. 18 Issue 8, p..8094-8106 (2010)


4. J. Schwider:
   Multiple beam Fizeau interferometer with frequency comb illumination
   Opt. Comm., 282, p.3308-3324 (2009)


5. Gerd Leuchs, Klaus Mantel, Andreas Berger, Hildegard Konermann, Markus Sondermann, Ulf Peschel, Norbert Lindlein, and Johannes Schwider :
   Interferometric null test of a deep parabolic reflector generating a Hertzian dipole field
   Applied Optics, 47, p.5570-5584 (2008)


6. R. Schreiner, J. Schwider, N. Lindlein, and K. Mantel :
   Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions
   Applied Optics, 47, p.6134-6141 (2008)


7. J. Schwider:
   Fizeau-type Multi-Pass Shack-Hartmann-Test
   Opt. Expr., 16,Issue 1, p.362-372 (2008)


8. G. Leuchs, N. Lindlein,K. Mantel; M. Sondermann, H. Konermann, J. Schwider:
   Interferometric null test of a parabolic reflectorgenerating a Hertzian dipole field
   Proc. SPIE, 7063, p. (2008)


9. J. Schwider:
   Coarse frequency comb interferometry
   Proc. SPIE, 7063, p.04.1-04.15 (2008)


10. G.S. Khan, K. Mantel, I. Harder, N. Lindlein, J. Schwider:
    Design considerations for the absolute testing approach of aspherics using combined diffractive optical elements.
    Appl. Opt., 46(28), p.7040-7048 (2007)


11. J. Schwider, N. Lindlein, K. Mantel, I. Harder:
    On the calibration of diffractive nulls for transmission test of aspheric components
    Opt. Comm., 279, p.262-272 (2007)


12. J. Schwider:
    Superposition fringes for profiling applications
    Proc. SPIE, 6616, p.paper59 (2007)


13. K. Mantel, J. Lamprecht, N. Lindlein, J. Schwider:
    Absolute calibration in grazing incidence interferometry via rotational averaging.
    Appl. Opt., 45(16), p.3740-3745 (2006)


14. K. Mantel, J. Lamprecht, N. Lindlein, J. Schwider:
    Calibration for cylindrical specimens in grazing-incidence interferometry via integration of difference measurements.
    Appl. Opt., 45(31), p.8013-8018- (2006)


15. F. Simon, G. Khan, K. Mantel, N. Lindlein, J .Schwider:
    Quasi-absolute measurement of aspheres with a combined diffractive optical element as reference.
    Appl. Opt., 45(22), p.8606-8612 (2006)


16. J. Lamprecht, N. Lindlein, J. Schwider:
    Characterization of cylindrical micro-lenses in transmitted light and with grazing incidence interferometry in reflected light
    Proc. SPIE, 6188, p.Art.No.618816 (2006)


17. J. Schwider:
    Fringe localization in the Twyman-Green Interferometer using extended monochromatic sources”
    Proc. SPIE , 6392, p. 0G1-0G12 (2006)


18. K. Mantel, N. Lindlein, J. Schwider:
    Simultaneous characterization of the quality and orientation of cylindrical lens surfaces.
    Appl. Opt., 44(15), p.2970-2977 (2005)


19. K. Mantel, N. Lindlein, J. Schwider:
    Simultaneous characterization of the quality and orientation of cylindrical lens surfaces
    Appl. Opt.-OT , 44, p.2970-2977 (2005)


20. J. Schwider:
    MOEMS, Micro-Optico-Electro-Mechanical Systems, ed. M. Motamedi
    Monography, chapt. Micro-optical Testing, SPIE Press, p.222 (2005)


21. J. Schwider, G. Fütterer, N. Lindlein:
    Diffractive lateral shearing interferometer for phase shift mask measurement using an excimer laser source
    Proc. 8-th International Symposium on Laser Metrology Merida Mexico, SPIE, Volume 5776, , p.270-277 (2005)


22. N. Lindlein, J. Lamprecht, J. Schwider:
    Interferometric measurement of microlenses including cylindrical lenses.
    In Microoptics, ed. J. Jahns, K.-H. Brenner, Springer, New York, , p. (2004)


23. J. Schneider, K. Mantel, R. Schreiner, N. Lindlein, J. Schwider:
    Compensation of the Anamorphic Distortion in Grazing Incidence Interferometry.
    Appl. Opt., 42(22), p.4480 (2003)


24. Pfortner, A.; Schwider, J. :
    Red-green-blue interferometer for the metrology of discontinuous structures
    Appl. Opt. (USA) , 42 , p.667-673 (2003 )


25. Schreiner, R.; Beyerlein, M.; Harder, I.; Dresel, T.; Lindlein, N.; Schwider, J. :
    Form assessment of hollow cylindrical specimens
    Appl. Opt. (USA) , 41 , p.64 (2002 )


26. Beyerlein, M.; Lindlein, N.; Schwider, J. :
    Dual-wave-front computer-generated holograms for quasi-absolute testing of aspherics
    Appl. Opt. (USA) , 41 , p.2440 (2002 )


27. Ottevaere, H.; Volckaerts, B.; Lamprecht, J.; Schwider, J.; Hermanne, A.; Veretennicoff, I.; Thienpont, H. :
    Two-dimensional plastic microlens arrays by deep lithography with protons: Fabrication and characterization
    J. Opt. A, Pure Appl. Opt. (UK) , 4 , p.S22 (2002 )


28. Schwider, J.; Lindlein, N.; Schreiner, R.; Lamprecht, J. :
    Grazing-incidence test for cylindrical microlenses with high numerical aperture
    J. Opt. A, Pure Appl. Opt. (UK) , 4 , p.S10 (2002 )


29. Schwider, J.; Lamprecht, J. :
    Interferometric testing of refractive microcylinder lenses
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 4778 , p.177 (2002 )


30. Pfortner, A.; Schwider, J. :
    3 lambda -metrology
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 4777 , p.194-201 (2002 )


31. Fuetterer, G.; Lano, M.; Lindlein, N.; Schwider, J. :
    Lateral shearing interferometer for phase-shift mask measurement at 193 nm
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 4691 , p.541 (2002 )


32. Fuetterer, G.; Herbst, W.; Rottstegge, J.; Ferstl, M.; Sebald, M.; Schwider, J. :
    Interference patterning of gratings with a period of 150 nm at a wavelength of 157 nm
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 4691 , p.1703 (2002 )


33. Rottstegge, J.; Herbst, W.; Hien, S.; Fuetterer, G.; Eschbaumer, C.; Hohle, C.; Schwider, J.; Sebald, M. :
    Ultrathin film imaging at 157 nm
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 4690 , p.233 (2002 )


34. Schwider, J.; Lindlein, N.; Schreiner, R.; Lamprecht, J.; Leuchs, G.; Pfund, J.; Beyerlein, M. :
    Optical testing of refractive microlenses
    Tech. Mess. tm (Germany) , 69 , p.467 (2002 )


35. Pfund, J.; Lindlein, N.; Schwider, J. :
    Nonnull testing of rotationally symmetric aspheres: a systematic error assessment
    Appl. Opt. (USA) , 40 , p.439 (2001 )


36. Pfortner, A.; Schwider, J. :
    Dispersion error in white-light Linnik interferometers and its implications for evaluation procedures
    Appl. Opt. (USA) , 40 , p.6223-6228 (2001 )


37. Schwider, J.; Dresel, T.; Beyeriein, M.; Horder, I.; Lindlein, N.; Collischon, M.; Leuchs, G. :
    Diffractive optical elements for light manipulation
    LaserOpto (Germany) , 33 , p.41 (2001 )


38. Lindlein, N.; Pfund, J.; Schwider, J. :
    Algorithm for expanding the dynamic range of a Shack-Hartmann sensor by using a spatial light modulator array
    Opt. Eng., Bellingham (USA) , 40 , p.837 (2001 )


39. Kipfer, P.; Collischon, M.; Haidner, H.; Schafer, H.; Schwider, J. :
    A novel design for beam forming grating couplers
    Optik (Germany) , 112 , p.76 (2001 )


40. Dresel, T.; Lindlein, N.; Schwider, J. :
    Empirical strategy for detection and removal of misalignment aberrations in interferometry
    Optik (Germany) , 112 , p.304 (2001 )


41. Lindlein, N.; Schwider, J. :
    Optical measurement methods for refractive microlenses and arrays
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 4455 , p.264 (2001 )


42. Ottevaere, H.; Tuteleers, P.; Volchaerts, B.; Baukens, V.; Lamprecht, J.; Schwider, J.; Hermanne, A.; Naessens, K.; Veretennicoff, I.; Thienpont, H. :
    Microlens arrays fabricated by deep lithography with protons and their characterization
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 4455 , p.272 (2001 )


43. Lindlein, N.; Lamprecht, J.; Mantel, K.; Schwider, J. :
    Interferometrical measurement of cylindrical lenses with the help of computer generated holograms
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 4440 , p.127 (2001 )


44. Groening, S.; Sick, B.; Donner, K.; Pfund, J.; Lindlein, N.; Schwider, J. :
    Wave-front reconstruction with a Shack-Hartmann sensor with an iterative spline fitting method
    Appl. Opt. (USA) , 39 , p.561 (2000 )


45. Pfund, J.; Schwider, J. :
    Laser beam characterization by using a Shack-Hartmann sensor
    Conference Digest. 2000 Conference on Lasers and Electro-Optics Europe (Cat. No.00TH8505) , , p. (2000 )


46. Breitkopf, P.; Collischon, M.; Schmidt, J.; Schwider, J. :
    Holographically recorded axicon for grazing incidence interferometry
    J. Mod. Opt. (UK) , 47 , p.701 (2000 )


47. Hettwer, A.; Kranz, J.; Schwider, J. :
    Three channel phase-shifting interferometer using polarization-optics and a diffraction grating
    Opt. Eng., Bellingham (USA) , 39 , p.960 (2000 )


48. Lindlein, N.; Pfund, J.; Schwider, J. :
    Expansion of the dynamic range of a Shack-Hartmann sensor by using astigmatic microlenses
    Opt. Eng., Bellingham (USA) , 39 , p.2220 (2000 )


49. Nurge, H.; Schwider, J. :
    Measurement of curvature and thickness variations of plane surfaces by grazing incidence interferometry
    Optik (Germany) , 111 , p.319 (2000 )


50. Schreiner, R.; Lindlein, N.; Dresel, T.; Schwider, J.; Brinkmann, S.; Mischo, H. :
    Testing acylindrical microlenses at grazing incidence
    Optik (Germany) , 111 , p.397 (2000 )


51. Nurge, H.; Schwider, J. :
    Testing of cylindrical lenses by grazing incidence interferometry
    Optik (Germany) , 111 , p.545 (2000 )


52. Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
    Grazing incidence interferometry using diffractive optical elements for the shape measurement of the mantle surface of rod-shaped objects. I. Measuring principle and theory
    Tech. Mess. tm (Germany) , 67 , p.10 (2000 )


53. Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
    Grazing incidence interferometry using diffractive optical elements for the shape measurement of the mantle surface of rod-shaped objects. II. Experiments and error assessment
    Tech. Mess. tm (Germany) , 67 , p.81 (2000 )


54. Beyerlein, M.; Schwider, J. :
    Comparing beam-shaping CGHs for coherent and partially coherent light
    Trends in Optics and Photonics. Diffractive Optics and Micro-Optics. Vol.41. Technical Digest. Postconference Edition , , p.29 (2000 )


55. Pfund, J.; Lindlein, N.; Schwider, J. :
    Non-null testing of aspherical surfaces by using a Shack-Hartmann sensor
    Trends in Optics and Photonics. Optical Fabrication and Testing. Vol.42. Technical Digest. Postconference Edition , , p.112 (2000 )


56. Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
    Testing of rod objects by grazing-incidence interferometry: experiment
    Appl. Opt. (USA) , 38 , p.121 (1999 )


57. Schwider, J.; Dresel, T.; Manzke, B. :
    Some considerations of reduction of reference phase error in phase-stepping interferometry
    Appl. Opt. (USA) , 38 , p.655 (1999 )


58. Emer, W.; Schwider, J. :
    Ultraviolet interferometry with apochromatic reflection optics
    Appl. Opt. (USA) , 38 , p.3516 (1999 )


59. S. Brinkmann, Th. Dresel, R. Schreiner, J. Schwider:
    *Das Diffraxicon-Interferometer zur Prüfung von Zylinderflächen*
    Laser, 3, p.28-31 (1999)


60. J. Schwider:
    Interferometric tests for aspherics”, in
    OSA TOPS Vol. 24 Fabrication and Testing of Aspheres; eds. J. S. Taylor, M. Piscotty, and A. Lindquist, 24, p.103-114 (1999)


61. Sickinger, H.; Schwider, J.; Manzke, B. :
    Fiber based Mach-Zehnder interferometer for measuring wave aberrations of microlenses
    Optik (Germany) , 110 , p.239 (1999 )


62. Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
    Interferometric testing of technical surfaces by grazing incidence interferometry in the infrared region
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3823 , p.115 (1999 )


63. Kranz, J.; Hettwer, A.; Lamprecht, J.; Schwider, J. :
    Error analysis for a single-frame phase-shifting speckle interferometer
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3749 , p.178 (1999 )


64. Pfund, J.; Lindlein, N.; Schwider, J. :
    Aspherical surface testing by using spherical compensation
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3749 , p.254 (1999 )


65. Schwider, J.; Brinkmann, S.; Schreiner, R.; Dresel, T. :
    Grazing incidence interferometry with the help of diffractive masters
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3749 , p.290 (1999 )


66. Nurge, H.; Schwider, J. :
    Testing of cylindrical lenses by grazing incidence interferometry
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3749 , p.609 (1999 )


67. Sharma, D.K.; Schwider, J. :
    Twyman Green interferometer with CGH for testing of cylindrical surfaces
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3729 , p.399 (1999 )


68. Wachter, C.; Schreiber, P.; Karthe, W.; Elbers, J.-P.; Glingener, C.; Voges, E.; Krabe, R.; Dumcke, R.; Reichl, H.; Hagner, G.; Schroter, S.; Bartelt, H.; Stock, E.A.; Bauer, G.; Schafer, W.; Sickinger, H.; Schwider, J. :
    Design and modelling of optical microsystems-an approach to a user-friendly system integration technique
    1998 International Conference on Modeling and Simulation of Microsystems, Semiconductors, Sensors and Actuators , , p.631 (1998 )


69. Pfund, J.; Lindlein, N.; Schwider, J. :
    Misalignment effects of the Shack-Hartmann sensor
    Appl. Opt. (USA) , 37 , p.22 (1998 )


70. Hocke, R.; Brand, H.; Collischon, M.; Schwider, J. :
    Line-selective CO/sub 2/ lasers with apodized Littrow-gratings
    ITG-Fachber. (Germany) , , p.393 (1998 )


71. Dresel, T.; Brinkmann, S.; Schreiner, R.; Schwider, T. :
    Testing of rod objects by grazing incidence interferometry: theory
    J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 15 , p.2921 (1998 )


72. Lindlein, N.; Simon, F.; Schwider, J. :
    Simulation of micro-optical array systems with RAYTRACE
    Opt. Eng., Bellingham (USA) , 37 , p.1809 (1998 )


73. Brinkmann, S.; Schreiner, R.; Dresel, T.; Schwider, J. :
    Interferometric testing of plane and cylindrical workpieces with computer-generated holograms
    Opt. Eng., Bellingham (USA) , 37 , p.2506 (1998 )


74. Pfund, J.; Lindlein, N.; Schwider, J.; Burow, R.; Blumel, Th.; Elssner, K.-E. :
    Absolute sphericity measurement: a comparative study of the use of interferometry and a Shack-Hartmann sensor
    Opt. Lett. (USA) , 23 , p.742 (1998 )


75. Eisner, M.; Lindlein, N.; Schwider, J. :
    Confocal microscopy with a refractive microlens-pinhole array
    Opt. Lett. (USA) , 23 , p.748 (1998 )


76. Pfund, J.; Lindlein, N.; Schwider, J. :
    Dynamic range expansion of a Shack-Hartmann sensor by use of a modified unwrapping algorithm
    Opt. Lett. (USA) , 23 , p.995 (1998 )


77. Schwider, J. :
    DOE-based interferometry
    Optik (Germany) , 108 , p.181 (1998 )


78. Emer, W.; Schwider, J. :
    Interferometry with VUV wavelengths
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3478 , p.202 (1998 )


79. Lindlein, N.; Schwider, J. :
    Measurement devices with and for micro-optics at the University of Erlangen
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3407 , p.47 (1998 )


80. Kranz, J.; Lamprecht, J.; Hettwer, A.; Schwider, J. :
    Fiber optical single frame speckle interferometer for measuring industrial surfaces
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3407 , p.328 (1998 )


81. Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
    Optical testing of cylindrical surfaces by grazing incidence interferometry in the infrared region
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3407 , p.443 (1998 )


82. Schwider, J. :
    White-light Fizeau interferometer
    Appl. Opt. (USA) , 36 , p.1433 (1997 )


83. Lindlein, N.; Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
    Axicon-type test interferometer for cylindrical surfaces: systematic error assessment
    Appl. Opt. (USA) , 36 , p.2791 (1997 )


84. Schreiber, H.; Schwider, J. :
    Lateral shearing interferometer based on two Ronchi phase gratings in series
    Appl. Opt. (USA) , 36 , p.5321 (1997 )


85. Gundlach, A.; Huntley, J.M.; Manzke, B.; Schwider, J. :
    Speckle shearing interferometry using a diffractive optical beamsplitter
    Opt. Eng., Bellingham (USA) , 36 , p.1488 (1997 )


86. Schwider, J.; Sickinger, H. :
    Array tests for microlenses
    Optik (Germany) , 107 , p.26 (1997 )


87. Brinkmann, S.; Schreiner, R.; Dresel, T.; Schwider, J. :
    Interferometric testing of technical surfaces with computer generated holograms
    Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 3098 , p.83 (1997 )


88. Dresel, T.; Beyerlein, M.; Schwider, J. :
    Design and fabrication of computer-generated beam-shaping holograms
    Appl. Opt. (USA) , 35 , p.4615 (1996 )


89. Dresel, T.; Beyerlein, M.; Schwider, J. :
    Design of computer generated beam-shaping holograms by iterative finite-element mesh adaption
    Appl. Opt. (USA) , 35 , p.6865 (1996 )


90. Dresel, T.; Schwider, J. :
    Fabrication of optical components by laser lithography
    Appl. Surf. Sci. (Netherlands) , 106 , p.379 (1996 )


91. Kipfer, P.; Collischon, M.; Haidner, H.; Schwider, J. :
    Subwavelength structures and their use in diffractive optics
    Opt. Eng., Bellingham (USA) , 35 , p.726 (1996 )


92. Schwider, J. :
    Achromatic design of holographic optical interconnects
    Opt. Eng., Bellingham (USA) , 35 , p.826 (1996 )


93. Falkenstorfer, O.; Lindlein, N.; Keinonen, T.; Schwider, J. :
    Diffraction-limited holographic lenses in dichromated gelatine
    Opt. Eng., Bellingham (USA) , 35 , p.2026 (1996 )


94. Eisner, M.; Schwider, J. :
    Transferring resist microlenses into silicon by reactive ion etching
    Opt. Eng., Bellingham (USA) , 35 , p.2979 (1996 )


95. Heissmeier, M.; Sheridan, J.T.; Schwider, J. :
    Calibration of a microlithographic fabrication process using non-destructive testing and rigorous electromagnetic theory
    Optik (Germany) , 103 , p.12 (1996 )


96. Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
    Axicon-type test interferometer for cylindrical surfaces
    Optik (Germany) , 102 , p.106 (1996 )


97. Du, C.; Zuerl, K.; Schwider, J. :
    Wavefront characterization with a miniaturized Shack-Hartmann sensor
    Optik (Germany) , 101 , p.151 (1996 )


98. Schwider, J.; Schreiber, H.; Zhou, L. :
    Physical limitations and challenges in modern interferometry
    Optik (Germany) , 101 , p.166 (1996 )


99. J. Schwider, O. Falkenstörfer:
    Twyman-Green interferometer for testing microspheres”,
    Opt. Eng. , 34, p.2972-2975 (1995)


100. Kobolla, H.; Schmidt, J.; Gluch, E.; Schwider, J. :
     Holographic perfect shuffle permutation element for a miniaturized switching network
     Appl. Opt. (USA) , 34 , p.2844 (1995 )


101. Volkel, R.; Junger, S.; Rosner, S.; Schwider, J.; Gruhler, U.; Schreck, H.; Burghardt, H.; Wiedeburg, K. :
     Optical backplane for a broadband switching system
     Electron. Lett. (UK) , 31 , p.234 (1995 )


102. Collischon, M.; Haidner, H.; Kipfer, P.; Schwab, M.; Schwider, J. :
     Optimized artificial index gratings
     Infrared Phys. Technol. (UK) , 36 , p.915 (1995 )


103. Korner, T.O.; Sheridan, J.T.; Schwider, J. :
     Interferometric resolution examined by means of electromagnetic theory
     J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 12 , p.752 (1995 )


104. Schwab, M.; Lindlein, N.; Schwider, J.; Amitai, Y.; Friesem, A.A.; Reinhorn, S. :
     Compensation of the wavelength dependence in diffractive star couplers
     J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 12 , p.1290 (1995 )


105. Schwider, J.; Falkenstorfer, O. :
     Twyman-Green interferometer for testing microspheres
     Opt. Eng., Bellingham (USA) , 34 , p.2972 -2975 (1995 )


106. Dresel, T.; Schwider, J.; Wehrhahn, A.; Babin, S. :
     Grazing incidence interferometry applied to the measurement of cylindrical surfaces
     Opt. Eng., Bellingham (USA) , 34 , p.3531 (1995 )


107. Zurl, K.; Gluch, E.; Schafer, B.; Schwider, J.; Fey, D.; Erhard, W. :
     Smart pixels with VCSELs: potential and demonstration system
     Optical Computing. Proceedings of the International Conference , , p.507 (1995 )


108. Koerner, T.O.; Sheridan, J.T.; Schwider, J. :
     Classical diffraction by deep rectangular gratings using the Legendre exact eigenfunction method
     Optik (Germany) , 99 , p.95 (1995 )


109. Kranz, J.; Mejri, J.; Zurl, K.; Schwider, J. :
     A monolithic optoelectronic high-speed receiver circuit
     Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2A , , p.226 (1995 )


110. Eisner, M.; Falkenstorfer, O.; Haselbeck, S.; Schwider, J. :
     Etched microlenses in silicon
     Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2A , , p.377 (1995 )


111. Dresel, Th.; Beyerlein, M.; Schwider, J. :
     Computer generated beam shaping holograms
     Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2B , , p.584 (1995 )


112. Schwider, J. :
     Achromatic design of holographic optical interconnects
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 2537 , p.148 (1995 )


113. Schwider, J.; Zhou, L. :
     Dispersive interferometric profilometer
     Proceedings of the International Seminar on Quantitative Microscopy. 125th PTB-Seminar (PTB-Bericht F-21) , , p.1 (1995 )


114. Collischon, M.; Haidner, I.; Kipfer, P.; Lang, A.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J. :
     Binary blazed reflection gratings
     Appl. Opt. (USA) , 33 , p.3572 (1994 )


115. Hutfless, J.; Rebhan, T.; Lutz, N.; Geiger, M.; Frank, M.; Streibl, N.; Schwider, J. :
     Micro optics for efficient material processing with excimer lasers
     Laser Optoelektron. (Germany) , 26 , p.50 (1994 )


116. Kipfer, P.; Collischon, M.; Haidner, H.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J. :
     Infrared optical components based on a microrelief structure
     Opt. Eng., Bellingham (USA) , 33 , p.79 (1994 )


117. Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Schwider, J. :
     Characterization of microlenses using a phase-shifting shearing interferometer
     Opt. Eng., Bellingham (USA) , 33 , p.2680 (1994 )


118. Schwider, T.; Streibl, N.; Schmidt, J.; Zurl, K.; Volkel, R. :
     Synchronous optical clock distribution for optoelectronic interconnections
     Opt. Lett. (USA) , 19 , p.75 (1994 )


119. Schwider, J. :
     Detection of undersampling from measured phase-shifting data
     Opt. Lett. (USA) , 19 , p.231 (1994 )


120. Schwider, J.; Liang Zhou :
     Dispersive interferometric profilometer
     Opt. Lett. (USA) , 19 , p.995 (1994 )


121. Sheridan, J.T.; Schwider, J.; Streibl, N.; Haselbeck, S.; Eisner, M.; Heissmeier, H.; Falkenstorfer, O. :
     Modelling and measurement of melted microlens shapes
     Optik (Germany) , 97 , p.174 (1994 )


122. Heissmeier, M.; Sheridan, J.T.; Schwider, J.; Streibl, N. :
     Detection of errors in microlithographic grating fabrication using a simple methodology
     Optik (Germany) , 95 , p.161 (1994 )


123. Kipfer, P.; Collischon, M.; Haidner, H.; Schwider, J. :
     Diffractive surface relief elements for the use in the infrared: waveguide structures as reflection holograms
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 2169 , p.100 (1994 )


124. Haselbeck, S.; Eisner, M.; Schreiber, H.; Schwider, J. :
     Reactive ion etching of microlens arrays into fused silica
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 2169 , p.142 (1994 )


125. Falkenstorfer, O.; Keinonen, T.; Lindlein, N.; Schwider, J.; Streibl, N. :
     Iterative correction of holographic lenses
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 2169 , p.200 (1994 )


126. Schwab, M.; Lindlein, N.; Schwider, J.; Amitai, Y.; Friesem, A.A.; Reinhorn, S. :
     Achromatic diffractive fan-out systems
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 2152 , p.173 (1994 )


127. Volkel, R.; Junger, S.; Kobolla, H.; Schmidt, J.; Schwider, J.; Streibl, N. :
     Optoelectronic interconnects with high packing densities
     Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.10 (1993 )


128. Schwider, J.; Haselbeck, S.; Schreiber, H.; Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Keinonen, T.; Sheridan, S.; Streibl, N. :
     Production and control of refractive and diffractive microlenses
     Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.47 (1993 )


129. Collischon, M.; Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J. :
     Design of artificial dielectric diffractive elements
     Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.204 (1993 )


130. Collischon, M.; Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J. :
     Diffractive optical elements for high power CO/sub 2/ laser applications
     Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.243 (1993 )


131. Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Collischon, M.; Hutfless, J.; Marz, M. :
     Diffraction grating with rectangular grooves exceeding 80% diffraction efficiency
     Infrared Phys. (UK) , 34 , p.467 (1993 )


132. Kobolla, H.; Sheridan, J.T.; Gluch, E.; Schmidt, J.; Volkel, R.; Schwider, J.; Streibl, N. :
     Holographic 2D mixed polarization deflection elements
     J. Mod. Opt. (UK) , 40 , p.613 (1993 )


133. Lindlein, N.; Schwider, J.; Schrader, M.; Falkenstorfer, O.; Volkel, R.; Streibl, N. :
     Wavelength mismatch correcting elements for volume holograms written on a laser pattern generator
     J. Mod. Opt. (UK) , 40 , p.647 (1993 )


134. Falkenstorfer, O.; Schwider, J.; Lindlein, N.; Bohm, A.; Schreiber, H.; Otto, A.; Volkel, R.; Zoller, A. :
     Interferometric measurement of holographic lenslets
     J. Mod. Opt. (UK) , 40 , p.733 (1993 )


135. Volkel, R.; Rosner, S.; Kobolla, H.; Schmidt, J.; Schwider, J.; Sheridan, J.T.; Streibl, N. :
     Measurements of the angular spectrum of stray-light for holographic optical elements in dichromated gelatin
     J. Mod. Opt. (UK) , 40 , p.1787 (1993 )


136. Gluch, E.; Kobolla, H.; Zurl, K.; Streibl, N.; Schwider, J. :
     Demonstration for an optoelectronic switching network
     J. Mod. Opt. (UK) , 40 , p.1857 (1993 )


137. Lindlein, N.; Schwider, J. :
     Local wave fronts at diffractive elements
     J. Opt. Soc. Am. A, Opt. Image Sci. (USA) , 10 , p.2563 (1993 )


138. Streibl, N.; Volkel, R.; Schwider, J.; Habel, P.; Lindlein, N. :
     Parallel optoelectronic interconnections with high packing density through a light-guiding plate using grating couplers and field lenses
     Opt. Commun. (Netherlands) , 99 , p.167 (1993 )


139. Haidner, H.; Sheridan, J.T.; Schwider, J.; Streibl, N. :
     Design of a blazed grating consisting of metallic subwavelength binary grooves
     Opt. Commun. (Netherlands) , 98 , p.5 (1993 )


140. Krackhardt, U.; Schwider, J.; Schrader, M.; Streibl, N. :
     Synthetic holograms written by a laser pattern generator
     Opt. Eng., Bellingham (USA) , 32 , p.781 (1993 )


141. Haselbeck, S.; Schreiber, H.; Schwider, J.; Streibl, N. :
     Microlenses fabricated by melting a photoresist on a base layer
     Opt. Eng., Bellingham (USA) , 32 , p.1322 (1993 )


142. Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J.; Collischon, M.; Lang, A.; Hutfless, J. :
     Polarizing reflection grating beamsplitter for the 10.6- mu m wavelength
     Opt. Eng., Bellingham (USA) , 32 , p.1860 (1993 )


143. Schwider, J.; Falkenstorfer, O.; Schreiber, H.; Zoller, A.; Streibl, N. :
     New compensating four-phase algorithm for phase-shift interferometry
     Opt. Eng., Bellingham (USA) , 32 , p.1883 (1993 )


144. Schwider, J.; Streibl, N.; Zurl, K. :
     Optoelectronic interconnections
     Parallel Computer Architectures Theory, Hardware, Software, Applications , , p.1 (1993 )


145. Schwider, J.; Haselbeck, S.; Schreiber, H.; Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Zoller, A.; Haidner, H.; Kipfer, P.; Heissmeier, M.; Keinonen, T.; Sheridan, J.T.; Brinkmann, S.; Streibl, N. :
     Production and control of refractive and diffractive microlenses
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1992 , p.102 (1993 )


146. Volkel, R.; Heibmeier, M.; Kobolla, H.; Krackhardt, U.; Rosner, S.; Schmidt, J.; Schwider, J.; Sheridan, J.T.; Streibl, N.; Zobel, F. :
     Optoelectronic interconnects with holographic optical elements
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1849 , p.104 (1993 )


147. Schmidt, J.; Volkel, R.; Rosner, S.; Stork, W.; Sheridan, J.T.; Durst, F.; Schwider, J.; Streibl, N. :
     Holographic optical coupling and beamsplitting elements for optoelectronic interconnects and sensors
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1751 , p.268 (1993 )


148. Streibl, N.; Heissmeier, M.; Hofmann, W.; Krackhardt, U.; Schrader, M.; Schwider, J.; Sperl, M. :
     Laser beam writing of computer generated diffractive optical components
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1732 , p.67 (1993 )


149. Falkenstorfer, O.; Schwider, J.; Bohm, A.; Schreiber, H. :
     Measurement of the wave aberrations of holographic optical lens elements
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1732 , p.112 (1993 )


150. Schmidt, J.; Volkel, R.; Schwider, J.; Sheridan, J.T.; Stork, W.; Streibl, N.; Stieglmeier, M.; Durst, F. :
     Holographic optical elements for interconnects and sensors
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1732 , p.271 (1993 )


151. Kobolla, H.; Sheridan, J.T.; Gluch, E.; Schwider, J.; Streibl, N. :
     Mixed polarization 2-D holographic permutation elements
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1732 , p.278 (1993 )


152. Lindlein, N.; Schwider, J.; Habel, P.; Schrader, M. :
     Computer generated holograms for the correction of the aberrations of thick holographic optical lens elements
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1718 , p.13 (1993 )


153. Falkenstorfer, O.; Schwider, J.; Bohm, A.; Schreiber, H. :
     Measurement of the wave aberrations of holographic optical lens elements
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1718 , p.22 (1993 )


154. Haselbeck, S.; Heissmeier, M.; Hofmann, W.; Krackhardt, U.; Manzke, B.; Savander, P.; Schrader, M.; Schwider, J.; Sperl, M.; Streibl, N. :
     Synthetic phase holograms written by laser lithography
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1718 , p.117 (1993 )


155. Schwider, J. :
     Measuring phase dispersion of dielectric multilayer stacks
     Appl. Opt. (USA) , 31 , p.6107 (1992 )


156. Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
     Possibilities and limitations of space-variant holographic optical elements for switching networks and general interconnects
     Appl. Opt. (USA) , 31 , p.7403 (1992 )


157. Schmidt, J.; Volkel, R.; Stork, W.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Durst, F. :
     Diffractive beam splitter for laser Doppler velocimetry
     Opt. Lett. (USA) , 17 , p.1240 (1992 )


158. Schwider, J. :
     Fizeau- and Michelson-type interferograms and their relation to the absolute testing of optical surfaces
     Optik (Germany) , 89 , p.113 (1992 )


159. Lindlein, N.; Schwider, J. :
     Practical notes on designing and analysing thick holographic optical elements
     Pure Appl. Opt. (UK) , 1 , p.111 (1992 )


160. Dresel, T.; Horstmann, A.; Otto, A.; Schwider, J. :
     UV interferometry for microstructure measurements
     Pure Appl. Opt. (UK) , 1 , p.241 (1992 )


161. Haumann, H.J.; Kobolla, H.; Sauer, F.; Schmidt, J.; Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
     Optoelectronic interconnection based on a light-guiding plate with holographic coupling elements
     Opt. Eng., Bellingham (USA) , 30 , p.1620 (1991 )


162. Kobolla, H.; Lindlein, N.; Falkenstorfer, O.; Rosner, S.; Schmidt, J.; Schwider, J.; Streibl, N.; Volkel, R. :
     Optoelectronic interconnects with holographic optical elements
     Third International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.342) , , p.123 (1991 )


163. Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
     Possibilities and limitations of space-variant holographic optical elements for switching networks and general interconnects
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1319 , p.130 (1990 )


164. Haumann, H.-J.; Kobolla, H.; Sauer, F.; Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
     Holographic coupling elements for optical bus systems based on a light-guiding optical backplane
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 1319 , p.588 (1990 )


165. J. Schwider:
     Advanced evaluation techniques in interferometry
     Prog. in Optics XXVIII, E. Wolf, Ed., Elsivier Publisher New York , 28, p.271-359 (1990)


166. Schwider, J. :
     Phase shifting interferometry: reference phase error reduction
     Appl. Opt. (USA) , 28 , p.3889 (1989 )


167. Lohmann, A.W.; Lukosz, W.; Schwider, J.; Streibl, N.; Thomas, J.A. :
     Array illuminators for the optical computer
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 963 , p.232 (1989 )


168. Lohmann, A.W.; Schwider, J.; Streibl, N.; Thomas, J. :
     Array illuminator based on phase contrast
     Appl. Opt. (USA) , 27 , p.2915 (1988 )


169. Kinnstaetter, K.; Lohmann, A.W.; Schwider, J.; Streibl, N. :
     Accuracy of phase shifting interferometry
     Appl. Opt. (USA) , 27 , p.5082 -5089 (1988 )


170. Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
     Semiconductor wafer and technical flat planeness testing interferometer
     Measurement (UK) , 5 , p.98 (1987 )


171. Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
     Semiconductor wafer and technical flat planeness testing interferometer
     Appl. Opt. (USA) , 25 , p.1117 (1986 )


172. Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. :
     Homogeneity testing by phase sampling interferometry
     Appl. Opt. (USA) , 24 , p.3059 (1985 )


173. Schwider, J. :
     Continuous lateral shearing interferometer
     Appl. Opt. (USA) , 23 , p.4403 (1984 )


174. Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
     High accuracy phase measurement in real time
     Proc. SPIE - Int. Soc. Opt. Eng. (USA) , 473 , p.156 (1984 )


175. Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R.; Merkel, K. :
     Digital wave-front measuring interferometry: some systematic error sources
     Appl. Opt. (USA) , 22 , p.3421-3432 (1983 )


176. Schwider, J. :
     Single sideband Ronchi test
     Appl. Opt. (USA) , 20 , p.2635 (1981 )


177. Schwider, J. :
     Superposition fringe shear interferometer
     Appl. Opt. (USA) , 19 , p.4233 (1980 )


178. Schwider, J.; Grzanna, J.; Spolaczyk, R.; Burow, R. :
     Testing aspherics in reflected light using blazed synthetic holograms
     Opt. Acta (UK) , 27 , p.683 (1980 )


179. Schwider, J. :
     Superposition fringes as a measuring tool in optical testing
     Appl. Opt. (USA) , 18 , p.2364 -2367 (1979 )


180. Schwider, J.; Burow, R. :
     Wave aberrations caused by misalignments of aspherics, and their elimination
     Opt. Appl. (Poland) , 9 , p.33 (1979 )


181. Schwider, J.; Burow, R.; Grzanna, J. :
     CGH-testing of rotational-symmetric aspheric in compensated interferometers
     Opt. Appl. (Poland) , 9 , p.39 (1979 )


182. Schwider, J.; Hiller, Ch. :
     The alignment of flat structures by means of Moire technique
     Opt. Acta (UK) , 23 , p.49 (1976 )


183. Schwider, J. :
     Interferometric measurement of the amplitude point spread function and the wavefront variation
     Opt. Acta (UK) , 23 , p.115 (1976 )


184. Schulz, G.; Schwider, J. :
     Interferometric testing of smooth surfaces
     Progress in optics, vol.XIII , , p.93 (1976 )


185. Schwider, J. :
     Absolute flatness by means of a combination of a standard with a compensating hologram
     Opt. Commun. (Netherlands) , 6 , p.58 (1972 )


186. Schwider, J. :
     Interferometrische Homogenitätsprüfung mit Kompensation
     Opt. Commun. (Netherlands) , 6 , p.106 (1972 )


187. Schwider, J. :
     On the solution of the mirroring problem by interferometric testing of absolute flatness and sphericity
     Opt. Commun. (Netherlands) , 5 , p.111 (1972 )


188. Schulz, G.; Schwider, J.; Hiller, C.; Kicker, B. :
     Establishing an optical flatness standard
     Appl. Opt. (USA) , 10 , p.929 -934 (1971 )


189. J. Schwider, R. Burow:
     Steigerung der Phasenempfindlichkeit mittels nichtlinearer Prozesse
     Exper. Techn. Phys., 18, p.255 (1970)


190. J. Schwider, R. Burow:
     Nonlinearities in image holography
     J. Opt. Soc. Am., 60, p.1421 (1970)


191. Schulz, G.; Schwider, J.; Hiller, Ch.; Kicker, B. :
     Absolute measurements of planarity standards
     Mon.ber. Dtsch. Akad. Wiss. Berl. (East Germany) , 12 , p.763 (1970 )


192. J. Schwider:
     Informationssteigerung in der Vielstrahlinterferometrie
     Opt. Acta, 15, p.351-372 (1968)


193. G. Schulz , J. Schwider:
     Precise measurement of planeness
     Appl. Opt., 6, p.1077-1084 (1967)


194. J. Schwider, Thesis PhD:
     Absolute Ebenheitsprüfung aus interferentiellen Relativmessungen zwischen 3 Planflächennormalen
     Dissertation Humboldt Universität, Dr. rer. nat., , p. (1967)


195. J. Schwider:
     Ein Interferenzverfahren zur Absolutprüfung von Planflächennormalen II
     Opt. Acta , 14, p.389-400 (1967)


196. J. Schwider, G. Schulz, R. Riekher, G. Minkwitz:
     Ein Interferenzverfahren zur Absolutprüfung von Planflächennormalen I
     Opt. Acta, 13, p.103-119 (1966)


197. J. Schwider:
     Entkopplungsmöglichkeiten von Fabry-Perot Interferometern
     Opt. Acta, 12, p.65-79 (1965)


198. J. Schwider, I. Harder:
     A diffractive Polarization-Fizeau-interferometer
     EOS Topical Meeting, , p. ()


199. J. Schwider, I. Harder:
     A diffractive Polarization-Fizeau-interferometer
     EOS Topical Meeting on Diffractive Optics Barcelona, Poster, p. (Nov. 2007)